Journey to Data Quality | 
 enlarge | Authors: Yang W. Lee, Leo L. Pipino, James D. Funk, Richard Y. Wang
Publisher: The MIT Press
Category: Book
List Price: $36.00
Buy New: $23.93
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New (21) Used (7) from $19.17
Sales Rank: 676965
Media: Hardcover
Number Of Items: 1
Pages: 240
Shipping Weight (lbs): 0.9
Dimensions (in): 9.1 x 6.1 x 0.9
ISBN: 0262122871
Dewey Decimal Number: 658.4038
EAN: 9780262122870
ASIN: 0262122871
Publication Date: October 1, 2006
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Product Description
All organizations today confront data quality problems, both systemic and structural. Neither ad hoc approaches nor fixes at the systems level?installing the latest software or developing an expensive data warehouse?solve the basic problem of bad data quality practices. Journey to Data Quality offers a roadmap that can be used by practitioners, executives, and students for planning and implementing a viable data and information quality management program. This practical guide, based on rigorous research and informed by real-world examples, describes the challenges of data management and provides the principles, strategies, tools, and techniques necessary to meet them.
The authors, all leaders in the data quality field for many years, discuss how to make the economic case for data quality and the importance of getting an organization's leaders on board. They outline different approaches for assessing data, both subjectively (by users) and objectively (using sampling and other techniques). They describe real problems and solutions, including efforts to find the root causes of data quality problems at a healthcare organization and data quality initiatives taken by a large teaching hospital. They address setting company policy on data quality and, finally, they consider future challenges on the journey to data quality.
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