Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits (Frontiers in Electronic Testing Volume 17) (Frontiers in Electronic Testing)

The book consists of:

Part I: Introduction, Test Process and ATE, Test Economics and Product Quality, Fault Modeling;

Part II: Logic and Fault Simulation, Testability Measures, Combinatorial ATPG, Sequential ATPG, Memory Test, DSP-Based Analog Test, Model-Based Analog Test, Delay Test, IDDQ Test;

Part III: DFT and Scan Design, BIST, Boundary Scan, Analog Test Bus, System Test and Core-Based Design, Future Testing;

Appendices: Cyclic Redundancy Code Theory, Primitive Polynomials, Books on Testing; Bibliography: over 700 entries.

Certainly not a good text book for students nor it
is a good book for ATE engineers. However, if you are looking
for some quick reference, this book is a good place to start
because it contains brief summaries of other people's work.


Excellent textbook for VLSI testing.   April 19, 2003
 5 out of 5 found this review helpful

This book is, as far as I know, the most comprehensive texbook on VLSI testing available at the moment. It is based on current trends and techniques in the field. After all, the authors are pioneers in this area. A worthy successor to Abramovici's earlier textbook, which, I think is beginning to look increasingly archaic. As a guy who's taken a course in testing by the authors (we were the guinea pigs for the book, actually)and is currently working in the VLSI testing area, I strongly recommend it to anyone looking to build strong testing fundamentals.