Tech Quarto
Search Advanced SearchView Cart   Checkout   
 Location:  Home » Mobile & Wireless » Digital Communications Test and Measurement: High-Speed Physical Layer Characterization (Prentice Hall Modern Semiconductor Design Series' Sub Series: PH Signal Integrity Library)  
Categories
Computer Science
The Internet
For Dummies
Web Browsers
Windows
Digital Culture
Multimedia
Mobile & Wireless
Visit Laptop Nirvana for the best Cheap Discount Laptops
Bestsellers
Practical Radio Frequency Test and Measurement: A Technician's Handbook
An Introduction to Mixed-Signal IC Test and Measurement (The Oxford Series in Electrical and Computer Engineering)
Lithography Process Control (SPIE Tutorial Texts in Optical Engineering Vol. TT28)
McGraw-Hill Electronic Testing Handbook: Procedures and Techniques
Industrial Electrical Troubleshooting (Electrical Trades)
Esd Program Management: A Realistic Approach to Continuous Measurable Improvement in Static Control (The Springer International Series in Engineering and Computer Science)
Electronic Test Instruments: Analog and Digital Measurements (2nd Edition)
Fiber Optic Test and Measurement (Hewlett-Packard Professional Books)
High Voltage Test Techniques
Digital Communications Test and Measurement: High-Speed Physical Layer Characterization (Prentice Hall Modern Semiconductor Design Series' Sub Series: PH Signal Integrity Library)

Digital Communications Test and Measurement: High-Speed Physical Layer Characterization (Prentice Hall Modern Semiconductor Design Series' Sub Series: PH Signal Integrity Library)

Digital Communications Test and Measurement: High-Speed Physical Layer Characterization (Prentice Hall Modern Semiconductor Design Series' Sub Series: PH Signal Integrity Library)

zoom enlarge 
Authors: Dennis Derickson, Marcus Mueller
Publisher: Prentice Hall PTR
Category: Book

List Price: $104.00
Buy New: $63.00
You Save: $41.00 (39%)



New (30) Used (12) from $63.00

Sales Rank: 630983

Media: Hardcover
Edition: 1
Number Of Items: 1
Pages: 976
Shipping Weight (lbs): 3.4
Dimensions (in): 9.3 x 7.2 x 2

ISBN: 0132209101
Dewey Decimal Number: 621.382
EAN: 9780132209106
ASIN: 0132209101

Publication Date: December 20, 2007
Availability: Usually ships in 1-2 business days

Editorial Reviews:

Product Description

A Comprehensive Guide to Physical Layer Test and Measurement of Digital Communication Links

Today's new data communication and computer interconnection systems run at unprecedented speeds, presenting new challenges not only in the design, but also in troubleshooting, test, and measurement. This book assembles contributions from practitioners at top test and measurement companies, component manufacturers,and universities. It brings together information that has never been broadly accessible beforeainformation that was previously buried in application notes, seminar and conference presentations, short courses, and unpublished works.

Readers will gain a thorough understanding of the inner workings of digital high-speed systems, and learn how the different aspects of such systems can be tested. The editors and contributors cover key areas in test and measurement of transmitters (digital waveform and jitter analysis and bit error ratio), receivers (sensitivity, jitter tolerance, and PLL/CDR characterization), and high-speed channel characterization (in time and frequency domain). Extensive illustrations are provided throughout.

Coverage includes

  • Signal integrity from a measurement point of view
  • Digital waveform analysis using high bandwidth real-time and sampling (equivalent time) oscilloscopes
  • Bit error ratio measurements for both electrical and optical links
  • Extensive coverage on the topic of jitter in high-speed networks
  • State-of-the-art optical sampling techniques for analysis of 100 Gbit/s + signals
  • Receiver characterization: clock recovery, phase locked loops, jitter tolerance and transfer functions, sensitivity testing, and stressed-waveform receiver testing
  • Channel and system characterization: TDR/T and frequency domain-based alternatives
  • Testing and measuring PC architecture communication links: PCIexpress, SATA, and FB DIMM


Powered by Associate-O-Matic