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Practical Radio Frequency Test and Measurement: A Technician's Handbook
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McGraw-Hill Electronic Testing Handbook: Procedures and Techniques
Industrial Electrical Troubleshooting (Electrical Trades)
Esd Program Management: A Realistic Approach to Continuous Measurable Improvement in Static Control (The Springer International Series in Engineering and Computer Science)
Electronic Test Instruments: Analog and Digital Measurements (2nd Edition)
Fiber Optic Test and Measurement (Hewlett-Packard Professional Books)
High Voltage Test Techniques
Digital Communications Test and Measurement: High-Speed Physical Layer Characterization (Prentice Hall Modern Semiconductor Design Series' Sub Series: PH Signal Integrity Library)
 

Measurements



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Arithmetic Built-In Self-Test for Embedded Systems 
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 Arithmetic Built-In Self-Test for Embedded Systems
Authors: Janusz Rajski, Jerzy Tyszer

List Price: $89.00
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Sales Rank: 3424446
Category: Book
ASIN: 0137564384
Publication Date: October 1997
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 IEEE Standard Methodology for Reliability Prediction and Assessment for Electronic Systems and Equipment
Publisher: Inst of Elect & Electronic

Buy New: $69.00



Sales Rank: 6406622
Category: Book
ASIN: 0738115517
Publication Date: July 1999
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 Telecommunications Measurements, Analysis, and Instrumentation
Author: Kamilo Feher

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Avg. Customer Rating: 1.0 out of 5 stars 2 reviews
Sales Rank: 2710378
Category: Book
ASIN: 0139024042
Publication Date: January 1987
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Condition: Very Good 8vo-over 7 3/4"'"-9 3/4"'" tall. Copy has name inked inside front cover, 1pp with highlights. Presents the engineering considerations necessary for the comprehension of modern telecommunication measurement and realted instrumentation and analysis techniques. xx/412pp. Desirable!
Sensors Transducers Labview 
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 Sensors Transducers Labview
Author: B. E. Paton

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Sales Rank: 1642004
Category: Book
ASIN: 0130811556
Publication Date: October 15, 1998
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Condition: FREE USPS Expedited shipping Upgrade! Includes unopened CD, softcover, moderate shelf wear, corners/edges slightly worn/bent, some smudges/marks on page edges, used stickers on spine/back cover, -JCC



1997 IEEE International Integrated Reliability Workshop Final Report: Stanford Sierra Camp, Lake Tahoe, California, October 13-16, 1997 
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 1997 IEEE International Integrated Reliability Workshop Final Report: Stanford Sierra Camp, Lake Tahoe, California, October 13-16, 1997
Author: Calif.) International Integrated Reliability Workshop (2001 : Lake Tahoe

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Category: Book
ASIN: 0780342054
Publication Date: December 1997
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Consumer Electronics Component Handbook: How to Identify, Locate, and Test Consumer Electronic Components (TAB Electronics Technical Library) 
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 Consumer Electronics Component Handbook: How to Identify, Locate, and Test Consumer Electronic Components (TAB Electronics Technical Library)
Author: Homer L. Davidson

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Sales Rank: 1954141
Category: Book
ASIN: 007015807X
Publication Date: October 19, 1998
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