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Practical Radio Frequency Test and Measurement: A Technician's Handbook
An Introduction to Mixed-Signal IC Test and Measurement (The Oxford Series in Electrical and Computer Engineering)
Lithography Process Control (SPIE Tutorial Texts in Optical Engineering Vol. TT28)
McGraw-Hill Electronic Testing Handbook: Procedures and Techniques
Industrial Electrical Troubleshooting (Electrical Trades)
Esd Program Management: A Realistic Approach to Continuous Measurable Improvement in Static Control (The Springer International Series in Engineering and Computer Science)
Electronic Test Instruments: Analog and Digital Measurements (2nd Edition)
Fiber Optic Test and Measurement (Hewlett-Packard Professional Books)
High Voltage Test Techniques
Digital Communications Test and Measurement: High-Speed Physical Layer Characterization (Prentice Hall Modern Semiconductor Design Series' Sub Series: PH Signal Integrity Library)
 

Measurements



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Introduction to Mechatronics & Measurement Systems 
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 Introduction to Mechatronics & Measurement Systems
Authors: David G. Alicatore, Michael B. Histand

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Avg. Customer Rating: 3.0 out of 5 stars 4 reviews
Sales Rank: 1849678
Category: Book
ASIN: 007029089X
Publication Date: July 23, 1998
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Detector Circuits (Newnes Circuits Series) 
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 Detector Circuits (Newnes Circuits Series)
Author: Rudolf F. Graf

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Sales Rank: 2950176
Category: Book
ASIN: 0750698799
Publication Date: October 1996
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Introduction to Instrumentation and Measurements 
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 Introduction to Instrumentation and Measurements
Author: Robert B. Northrop

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Sales Rank: 1529353
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ASIN: 0849378982
Publication Date: June 13, 1997
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 1998 IEEE 15th Annual Semiconductor Thermal Measurement and Management Symposium (Semi-Therm)
Author: California) Ieee Semiconductor Thermal Measurement And Management Symposium (15th : 1999 : San Diego

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Category: Book
ASIN: 0780352645
Publication Date: March 1999
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 Statistical Metrology 2000 4th International Workshop
Author: International Workshop On Statistical Metrology (5th : 2000 : Hawaii)

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ASIN: 0780358961
Publication Date: February 15, 2001
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 Iwsm 1999 International Workshop on Statistical Metrology: June 12, 1999/Kyoto
Authors: Ieee, Ieee Electron Devices Society

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ASIN: 0780351541
Publication Date: August 1999
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 1994 Conference on Precision Electromagnetic Measurements Digest 27 June-1 July 1994 Boulder, Colorado, USA (Conference on Precision Electromagnetic Measurements//C P E M Digest)
Author: Edie Deweese

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Category: Book
ASIN: 0780319842
Publication Date: July 1994
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 Conference Proceedings: Imtc/94 Advanced Technologies in I & M : Grand Hotel Hamamatsu Hamamatsu, Japan May 10-12, 1994
Publisher: Ieee

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ASIN: 0780318803
Publication Date: July 1994
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 1996 IEEE Autotestcon
Author: Ohio) Autotestcon 96 (32nd : 1996 : Dayton

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ASIN: 0780333799
Publication Date: April 1997
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 Itc/Usa/'95: International Telemetering Conference : Theme : Re-Engineering Telemetry (International Telemetering Conference (U S)//Proceedings)
Author: International Society For Measurement An

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Category: Book
ASIN: 1556175566
Publication Date: June 1995
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Condition: MISSING DUST JACKET -- Visible shelf wear -- may have some notes/markings on pages
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