Measurements
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 | | Imtc/99: Proceedings of the 16th IEEE Instrumentation and Measurement Technology Conference : Measurements for the New Millennium : Venice, Italy-May 24-26, 19 Author: Vincenzo Piuri
List Price: $324.00 Buy New: $279.00 You Save: $45.00 (14%)
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Sales Rank: 7173765 Category: Book ASIN: 0780352769 Publication Date: July 1999 Availability: Usually ships in 1-2 business days
|  | | Gaas Reliability Workshop, 1998: IEEE Electron Devices Society, Sponsor(S Authors: Ken Mcghee, Ieee
Buy New: $108.00
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Sales Rank: 7100050 Category: Book ASIN: 0790800659 Publication Date: April 1999 Shipping: Eligible for Super Saver Shipping Availability: In stock soon. Order now to get in line. First come, first served.
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 | | Electronics for Radiation Measurements Author: Gad Shani
Buy New: $211.86
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Avg. Customer Rating: 1 reviews Sales Rank: 6006661 Category: Book ASIN: 0849394953 Publication Date: February 1, 1996 Availability: Usually ships in 1-2 business days
|  | | 1997 IEEE Instrumentation and Measurement Technology Conference Author: Canada) Ieee Instrumentation And Measurement Technology Conference (1997 : Ottawa
Buy New: $210.00
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Sales Rank: 7043074 Category: Book ASIN: 0780337476 Publication Date: January 1998 Shipping: Eligible for Super Saver Shipping Availability: In stock soon. Order now to get in line. First come, first served.
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 | | 1995 IEEE Instrumentation and Measurement Technology Author: Ieee Boston Section
Buy New: $138.00
Sales Rank: 7016772 Category: Book ASIN: 0780326156 Publication Date: April 1995 Shipping: Eligible for Super Saver Shipping Availability: In stock soon. Order now to get in line. First come, first served.
|  | | High-Temperature Silicon Sensors Author: Sebastiaan Roderick In't Hout
Buy New: $57.50
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Sales Rank: 7286295 Category: Book ASIN: 9040713251 Publication Date: July 1996 Shipping: Eligible for Super Saver Shipping Availability: In stock soon. Order now to get in line. First come, first served.
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 | | IEEE Guide for Static Var Compensator Field Tests (Ieee Std 1303-1994) Publisher: Inst of Elect & Electronic
Buy New: $49.50
Category: Book ASIN: 1559374470 Publication Date: October 1994 Shipping: Eligible for Super Saver Shipping Availability: In stock soon. Order now to get in line. First come, first served.
|  | | Istfa '98: Proceedings of the 24th International Symposium for Testing and Failure Analysis, 15-19, November 1998, Hyatt Regency Dfw, Dallas, Texas Author: Asm
Buy New: $124.00
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Sales Rank: 7189572 Category: Book ASIN: 0871706695 Publication Date: September 1998 Shipping: Eligible for Super Saver Shipping Availability: Usually ships in 1 to 2 months
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| | A Unified Approach for Timing Verification and Delay Fault Testing Authors: Mukund Sivaraman, Andrzej J. Strojwas
List Price: $175.00 Buy New: $52.00 You Save: $123.00 (70%)
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Sales Rank: 4512327 Category: Book ASIN: 0792380797 Publication Date: January 15, 1998 Availability: Usually ships in 1-2 business days
|  | | 1995 IEEE 34th Annual Conference of the Society of Instrument and Control Engineers of Japan (Sice Author: Hokkaid O Daigaku
Buy New: $114.00
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Category: Book ASIN: 0780327810 Publication Date: September 1995 Shipping: Eligible for Super Saver Shipping Availability: In stock soon. Order now to get in line. First come, first served.
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