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Practical Radio Frequency Test and Measurement: A Technician's Handbook
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Industrial Electrical Troubleshooting (Electrical Trades)
Esd Program Management: A Realistic Approach to Continuous Measurable Improvement in Static Control (The Springer International Series in Engineering and Computer Science)
Electronic Test Instruments: Analog and Digital Measurements (2nd Edition)
Fiber Optic Test and Measurement (Hewlett-Packard Professional Books)
High Voltage Test Techniques
Digital Communications Test and Measurement: High-Speed Physical Layer Characterization (Prentice Hall Modern Semiconductor Design Series' Sub Series: PH Signal Integrity Library)
 

Measurements



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 Imtc/99: Proceedings of the 16th IEEE Instrumentation and Measurement Technology Conference : Measurements for the New Millennium : Venice, Italy-May 24-26, 19
Author: Vincenzo Piuri

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New (4) Used (2) from $110.00

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ASIN: 0780352769
Publication Date: July 1999
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 Gaas Reliability Workshop, 1998: IEEE Electron Devices Society, Sponsor(S
Authors: Ken Mcghee, Ieee

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Sales Rank: 7100050
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ASIN: 0790800659
Publication Date: April 1999
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 Electronics for Radiation Measurements
Author: Gad Shani

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Sales Rank: 6006661
Category: Book
ASIN: 0849394953
Publication Date: February 1, 1996
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 1997 IEEE Instrumentation and Measurement Technology Conference
Author: Canada) Ieee Instrumentation And Measurement Technology Conference (1997 : Ottawa

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ASIN: 0780337476
Publication Date: January 1998
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 1995 IEEE Instrumentation and Measurement Technology
Author: Ieee Boston Section

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ASIN: 0780326156
Publication Date: April 1995
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 High-Temperature Silicon Sensors
Author: Sebastiaan Roderick In't Hout

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ASIN: 9040713251
Publication Date: July 1996
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 IEEE Guide for Static Var Compensator Field Tests (Ieee Std 1303-1994)
Publisher: Inst of Elect & Electronic

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ASIN: 1559374470
Publication Date: October 1994
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 Istfa '98: Proceedings of the 24th International Symposium for Testing and Failure Analysis, 15-19, November 1998, Hyatt Regency Dfw, Dallas, Texas
Author: Asm

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ASIN: 0871706695
Publication Date: September 1998
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A Unified Approach for Timing Verification and Delay Fault Testing 
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 A Unified Approach for Timing Verification and Delay Fault Testing
Authors: Mukund Sivaraman, Andrzej J. Strojwas

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New (15) Used (6) from $35.95

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ASIN: 0792380797
Publication Date: January 15, 1998
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 1995 IEEE 34th Annual Conference of the Society of Instrument and Control Engineers of Japan (Sice
Author: Hokkaid O Daigaku

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Category: Book
ASIN: 0780327810
Publication Date: September 1995
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