Measurements
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 | | Test Gear and Measurements (Maplin Series)
Author: Danny Stewart
List Price: $20.82
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Sales Rank: 4310307
Category: Book
ASIN: 0750626011
Publication Date: March 1996
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Condition: In very good condition. Pages are crips and clean. No rips or scuffs. Great price! Great ratings. Your satisfaction is guaranteed
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| | Measuring Circuits (Newnes Circuits Series)
Author: Rudolf F. Graf
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Sales Rank: 2180361
Category: Book
ASIN: 0750698829
Publication Date: December 4, 1996
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| | Electronics Calculations Data Handbook
Author: Daniel Mcbrearty
List Price: $52.95
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Sales Rank: 4396765
Category: Book
ASIN: 0750637447
Publication Date: August 31, 1998
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| | | IEEE Instrumentation and Measurement Conference, Conference Record/86Ch2271-5
Publisher: Ieee
Buy New: $62.50
Sales Rank: 6825754
Category: Book
ASIN: 9996323153
Publication Date: December 1986
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| | IEEE Standard Definition, Specification, and Analysis of Systems Used for Supervisory Control, Data Acquisition, and Automatic Control (Ieee Std C37.)
Publisher: Inst of Elect & Electronic
Buy New: $98.00
Sales Rank: 6619868
Category: Book
ASIN: 1559374292
Publication Date: November 1994
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| | | Proceedings of the IEEE Third Working Conference on Current Measurement/86Ch2305-1
Author: Gerald F. Appell
Buy New: $47.00
Sales Rank: 6825753
Category: Book
ASIN: 9996353567
Publication Date: December 1986
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| | SOC (System-on-a-Chip) Testing for Plug and Play Test Automation (Frontiers in Electronic Testing)
Author: Krishnendu Chakrabarty
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Sales Rank: 5079985
Category: Book
ASIN: 1402072058
Publication Date: September 30, 2002
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| | | Cpem 86 Digest: 1986 Conference on Precision Electromagnetic Measurements : June 23-27, 1986 National Bureau of Standards Gaithersburg, Md, Usa/86Ch
Author: Ronald F. Dzuiba
Buy New: $55.00
Sales Rank: 6825774
Category: Book
ASIN: 9996323285
Publication Date: December 1986
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| | Actual Problems of Electronics Instrument Engineering, 1998
Author: Russia) International Conference On Actual Problems Of Electronic Instrument Engineering (4th : 1998 : Novosibirsk
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ASIN: 0780349385
Publication Date: March 1999
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| | Boundary-Scan Interconnect Diagnosis (Frontiers in Electronic Testing)
Authors: Jose T. De Sousa, Peter Y.k. Cheung
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Sales Rank: 3209940
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ASIN: 0792373146
Publication Date: February 28, 2001
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