Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits (Frontiers in Electronic Testing Volume 17) (Frontiers in Electronic Testing) | 
 enlarge | Authors: M. Bushnell, Vishwani Agrawal
Publisher: Springer
Category: Book
List Price: $94.00
Buy New: $62.67
You Save: $31.33 (33%)
New (15) Used (14) from $57.98
Avg. Customer Rating:  2 reviews
Sales Rank: 665421
Media: Hardcover
Number Of Items: 1
Pages: 712
Shipping Weight (lbs): 3.1
Dimensions (in): 10.2 x 6.9 x 1.7
ISBN: 0792379918
Dewey Decimal Number: 621.395
EAN: 9780792379911
ASIN: 0792379918
Publication Date: November 1, 2000
Availability: Usually ships in 1-2 business days
Shipping: Expedited shipping available
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Condition: New Book. International Shipping Available
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| Editorial Reviews:
Product Description
Today's electronic design and test engineers deal with several types of subsystems, namely, digital, memory, and mixed-signal, each requiring different test and design for testability methods. This book provides a careful selection of essential topics on all three types of circuits. The outcome of testing is product quality, which means `meeting the user's needs at a minimum cost.' The book includes test economics and techniques for determining the defect level of VLSI chips. Besides being a textbook for a course on testing, it is a complete testability guide for an engineer working on any kind of electronic device or system or a system-on-a-chip. The book consists of: Part I: Introduction, Test Process and ATE, Test Economics and Product Quality, Fault Modeling; Part II: Logic and Fault Simulation, Testability Measures, Combinatorial ATPG, Sequential ATPG, Memory Test, DSP-Based Analog Test, Model-Based Analog Test, Delay Test, IDDQ Test; Part III: DFT and Scan Design, BIST, Boundary Scan, Analog Test Bus, System Test and Core-Based Design, Future Testing; Appendices: Cyclic Redundancy Code Theory, Primitive Polynomials, Books on Testing; Bibliography: over 700 entries.
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| Customer Reviews:
 Not a good book for ATE October 20, 2003
5 out of 8 found this review helpful
It seems to me it is just a summary of work done by others in
the ATE field over the years. The explanations of how a device
fault is detected are not clear in most of the cases presented
in the book. The book emphasizes too much on fault
modeling but not enough on test applications and techniques. Certainly not a good text book for students nor it
is a good book for ATE engineers. However, if you are looking
for some quick reference, this book is a good place to start
because it contains brief summaries of other people's work.
 Excellent textbook for VLSI testing. April 19, 2003
5 out of 5 found this review helpful
This book is, as far as I know, the most comprehensive texbook on VLSI testing available at the moment. It is based on current trends and techniques in the field. After all, the authors are pioneers in this area. A worthy successor to Abramovici's earlier textbook, which, I think is beginning to look increasingly archaic. As a guy who's taken a course in testing by the authors (we were the guinea pigs for the book, actually)and is currently working in the VLSI testing area, I strongly recommend it to anyone looking to build strong testing fundamentals.
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