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Mobile & Wireless: Very-Large-Scale Integration (VLSI) (Vishwani Agrawal)



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Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits (Frontiers in Electronic Testing Volume 17) (Frontiers in Electronic Testing) 
zoom enlarge  		 Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits (Frontiers in Electronic Testing Volume 17) (Frontiers in Electronic Testing)
Authors: M. Bushnell, Vishwani Agrawal

List Price: $94.00
Buy New: $62.67
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New (15) Used (14) from $57.98

Avg. Customer Rating: 3.5 out of 5 stars 2 reviews
Sales Rank: 665421
Category: Book
ASIN: 0792379918
Publication Date: November 1, 2000
Availability: Usually ships in 1-2 business days
 Tutorial: Test Generation for Vlsi Chips
Author: Vishwani D. Agrawal

List Price: $30.00
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New (2) Used (2) from $3.97

Sales Rank: 3065873
Category: Book
ASIN: 081868786X
Publication Date: September 1988
Availability: Usually ships in 1-2 business days


Unified Methods for VLSI Simulation and Test Generation (The Springer International Series in Engineering and Computer Science) 
zoom enlarge  		 Unified Methods for VLSI Simulation and Test Generation (The Springer International Series in Engineering and Computer Science)
Authors: Kwang-ting (tim) Cheng, Vishwani D. Agrawal

List Price: $106.00
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New (16) Used (9) Collectible (1) from $6.00

Sales Rank: 5085635
Category: Book
ASIN: 0792390253
Publication Date: June 30, 1989
Availability: Usually ships in 1-2 business days
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